Comparaison de différentes analyses statistiques spatiales pour détecter une défaillance dans la fabrication de circuits intégrés
Le Gall, Caroline
Revue de Statistique Appliquée, Tome 52 (2004), p. 5-37 / Harvested from Numdam
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Publié le : 2004-01-01
@article{RSA_2004__52_1_5_0,
     author = {Le Gall, Caroline},
     title = {Comparaison de diff\'erentes analyses statistiques spatiales pour d\'etecter une d\'efaillance dans la fabrication de circuits int\'egr\'es},
     journal = {Revue de Statistique Appliqu\'ee},
     volume = {52},
     year = {2004},
     pages = {5-37},
     language = {fr},
     url = {http://dml.mathdoc.fr/item/RSA_2004__52_1_5_0}
}

Le Gall, Caroline. Comparaison de différentes analyses statistiques spatiales pour détecter une défaillance dans la fabrication de circuits intégrés. Revue de Statistique Appliquée, Tome 52 (2004) pp. 5-37. http://gdmltest.u-ga.fr/item/RSA_2004__52_1_5_0/

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