A New Bayesian Approach to Quality Control Charts.
Chiu, W.K. ; Leung, M.P.Y.
Metrika, Tome 27 (1980), p. 243-254 / Harvested from Göttinger Digitalisierungszentrum
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Publié le : 1980-01-01
EUDML-ID : urn:eudml:doc:186219 
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     title = {A New Bayesian Approach to Quality Control Charts.},
     journal = {Metrika},
     volume = {27},
     year = {1980},
     pages = {243-254},
     zbl = {0445.62107},
     url = {http://dml.mathdoc.fr/item/PPN358794056_0027+dmdlog52}
}

Chiu, W.K.; Leung, M.P.Y. A New Bayesian Approach to Quality Control Charts.. Metrika, Tome 27 (1980) pp. 243-254. http://gdmltest.u-ga.fr/item/PPN358794056_0027+dmdlog52/