Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.
Atreas, N. ; Karankias, C.
The journal of Fourier analysis and applications [[Elektronische Ressource]], Tome 5 (1999), p. 575-588 / Harvested from Göttinger Digitalisierungszentrum
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Publié le : 1999-01-01
EUDML-ID : urn:eudml:doc:59624 
@article{GDZPPN002548240,
     title = {Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.},
     journal = {The journal of Fourier analysis and applications [[Elektronische Ressource]]},
     volume = {5},
     year = {1999},
     pages = {575-588},
     zbl = {0948.42025},
     url = {http://dml.mathdoc.fr/item/GDZPPN002548240}
}

Atreas, N.; Karankias, C. Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.. The journal of Fourier analysis and applications [[Elektronische Ressource]], Tome 5 (1999) pp. 575-588. http://gdmltest.u-ga.fr/item/GDZPPN002548240/