This article considers the problem of multiple hypothesis testing using t-tests. The observed data are assumed to be independently generated conditional on an underlying and unknown two-state hidden model. We propose an asymptotically valid data-driven procedure to find critical values for rejection regions controlling the k-familywise error rate (k-FWER), false discovery rate (FDR) and the tail probability of false discovery proportion (FDTP) by using one-sample and two-sample t-statistics. We only require a finite fourth moment plus some very general conditions on the mean and variance of the population by virtue of the moderate deviations properties of t-statistics. A new consistent estimator for the proportion of alternative hypotheses is developed. Simulation studies support our theoretical results and demonstrate that the power of a multiple testing procedure can be substantially improved by using critical values directly, as opposed to the conventional p-value approach. Our method is applied in an analysis of the microarray data from a leukemia cancer study that involves testing a large number of hypotheses simultaneously.
@article{1297173846,
author = {Cao, Hongyuan and Kosorok, Michael R.},
title = {Simultaneous critical values for t-tests in very high dimensions},
journal = {Bernoulli},
volume = {17},
number = {1},
year = {2011},
pages = { 347-394},
language = {en},
url = {http://dml.mathdoc.fr/item/1297173846}
}
Cao, Hongyuan; Kosorok, Michael R. Simultaneous critical values for t-tests in very high dimensions. Bernoulli, Tome 17 (2011) no. 1, pp. 347-394. http://gdmltest.u-ga.fr/item/1297173846/