Intelligent control of the complex technology process based on adaptive pattern clustering and feature map.
Cheng, Wushan
Mathematical Problems in Engineering, Tome 2008 (2008), / Harvested from The Electronic Library of Mathematics
Access to full text
Full (PDF)
Publié le : 2008-01-01
DOI : https://doi.org/10.1155/2008/783278
EUDML-ID : urn:eudml:doc:55484 
@article{05564147,
     title = {Intelligent control of the complex technology process based on adaptive pattern clustering and feature map.},
     journal = {Mathematical Problems in Engineering},
     volume = {2008},
     year = {2008},
     doi = {10.1155/2008/783278},
     zbl = {1162.93360},
     language = {en},
     url = {http://dml.mathdoc.fr/item/05564147}
}

Cheng, Wushan. Intelligent control of the complex technology process based on adaptive pattern clustering and feature map.. Mathematical Problems in Engineering, Tome 2008 (2008) . doi : 10.1155/2008/783278. http://gdmltest.u-ga.fr/item/05564147/